 | Monter d'un niveau |
Lussier, A. W., Bourbonnais-Sureault, D., Chicoine, M., Martel, R., Martinu, L., Roorda, S., & Schiettekatte, F. (2024). Raman-based mapping and depth-profiling of the relaxation state in amorphous silicon. Journal of Applied Physics, 135(6), 065301 (12 pages). Lien externe
Abernathy, M., Amato, A., Ananyeva, A., Angelova, S., Baloukas, B., Bassiri, R., Billingsley, G., Birney, R., Cagnoli, G., Canepa, M., Coulon, M., Degallaix, J., Di Michele, A., Fazio, M. A., Fejer, M. M., Forest, D., Gier, C., Granata, M., Gretarsson, A. M., ... Yang, L. (2021). Exploration of co-sputtered Ta₂O₅–ZrO₂ thin films for gravitational-wave detectors. Classical and Quantum Gravity, 38(19), 40 pages. Disponible
