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Items where Author is "Liao, X. B."

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Jump to: 1998
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1998

Sheng, S. R., Liao, X. B., Kong, G. L., & Han, H. X. (1998). Study of Microstructure of High Stability Hydrogenated Amorphous Silicon Films by Raman Scattering and Infrared Absorption Spectroscopy. Applied Physics Letters, 73(3), 336-338. External link

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