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Study of Microstructure of High Stability Hydrogenated Amorphous Silicon Films by Raman Scattering and Infrared Absorption Spectroscopy

Shu Ran Sheng, X. B. Liao, G. L. Kong and H. X. Han

Article (1998)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/29326/
Journal Title: Applied Physics Letters (vol. 73, no. 3)
Publisher: American Institute of Physics
DOI: 10.1063/1.121826
Official URL: https://doi.org/10.1063/1.121826
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:18
Cite in APA 7: Sheng, S. R., Liao, X. B., Kong, G. L., & Han, H. X. (1998). Study of Microstructure of High Stability Hydrogenated Amorphous Silicon Films by Raman Scattering and Infrared Absorption Spectroscopy. Applied Physics Letters, 73(3), 336-338. https://doi.org/10.1063/1.121826

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