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Items where Author is "Kressmann, R."

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Jump to: 1998
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Kressmann, R., Amjadi, H., Sessler, G. M., Rats, D., Martinu, L., Sapieha, J.-E., & Wertheimer, M. R. (1998, October). Charge storage in PECVD silicon oxynitride layers [Paper]. Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Atlanta, GA, USA. External link

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