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Items where Author is "Koenraad, Paul M."

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Koelling, S., Plantenga, R. C., Hauge, H. I. T., Ren, Y., Li, A., Verheijen, M. A., Conesa Boj, S., Assali, S., Koenraad, P. M., & Bakkers, E. P. A. M. (2016, October). Impurity and defect monitoring in hexagonal Si and SiGe nanocrystals [Paper]. Symposium on SiGe, Ge, and Related Materials: Materials, Processing, and Devices 7 (PRiME 2016)/230th ECS Meeting, Honolulu, HI. Published in ECS Transactions, 75(8). External link

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