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La Haye, M. L., Chapman, G. H., Jung, C., Cheung, D. Y. H., Djaja, S., & Audet, Y. (janvier 2023). Fault-tolerant photodiode and photogate active pixel sensors [Communication écrite]. Sensors and camera systems for scientific and industrial applications VI, San Jose, CA (12 pages). Lien externe
La Haye, M. L., Chapman, G. H., Jung, C., Cheung, D. Y., Djaja, S., & Audet, Y. (octobre 2004). Characteristics of fault-tolerant photodiode and photogate active pixel sensors (APS) [Communication écrite]. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2004), Cannes, France. Lien externe
Cheung, D. Y. H., Chapman, G. H., Djaja, S., Audet, Y., Wai, B., & Jung, C. (janvier 2004). Fault tolerant Active Pixel Sensors for large area digital imaging systems [Communication écrite]. Optoelectronic integrated circuits VI, San Jose CA. Lien externe