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Boudjella, A., Jin, Z., & Savaria, Y. (2004). Electrical Field Analysis of Nanoscale Field Effect Transistors. Japanese Journal of Applied Physics, 43(6), 3831-3837. Lien externe
Jin, Z. (2002). Methods for the modeling and analysis of MIS interconnects in VLSI circuits [Thèse de doctorat, École Polytechnique de Montréal]. Disponible
