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Jamoussi, M., Amellal, S., & Kaminska, B. (décembre 1998). High-level testability evaluation of TASS synthesized systems [Communication écrite]. 10th International Conference on Microelectronics (ICM 1998), Monastir, Tunisia. Lien externe
Jamoussi, M., Kaminska, B., & Mukhedkar, D. (1994). Testability of one-dimensional iterative arrays using a variable testability measure. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, 41(1), 82-86. Lien externe
Jamoussi, M., Kaminska, B., & Mukhedkar, D. (janvier 1992). A New variable testability measure: A concept for data-flow testability evaluation [Communication écrite]. 5th International Conference on VLSI Design (ICVD 1992), Banglore, India. Lien externe
