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Caron, M., Gagnon, G., Gauvin, R., Hovington, P., Drouin, D., Currie, J. F., Tremblay, Y., Ouellet, L., Bigerger, M., & Wong, F. (juin 1996). An iterative procedure based on Monte Carlo simulation to determine the thickness and composition of VLSI metallization [Communication écrite]. 13th International VLSI Multilevel Interconnection (V-MIC) Conference, Santa Clara, CA, USA. Non disponible
Hovington, P., L'Espérance, G., Baril, E., & Rigaud, M. (1995). Monitoring the performance of energy-dispersive spectrometer detectors at low-energy. Journal of scanning microscopy, 17(3), 136-138. Lien externe
L'Espérance, G., Hovington, P., Baril, E., & Blais, C. (janvier 1994). Procedures and samples to monitor the long term low energy performance of energy-dispersive X-ray spectrometers [Communication écrite]. Réunion conjointe microscopy society of america (52ieme réunion annuelle) et microbeam analysis society (28ieme réunion annuelle), Nouvelle-Orléan, Louisiana, USA. Non disponible
