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Items where Author is "Hossein, F. M."

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Sylla, I. T., Slamani, M., Kaminska, B., Hossein, F. M., & Vincent, P. (1998, April). Impedance mismatch and lumped capacitance effects in high frequency testing [Paper]. 16th IEEE VLSI Test Symposium, Monterey, CA, USA. External link

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