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Documents dont l'auteur est "Hashemi, S."

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Aller à : 2013 | 2012 | 2009 | 2006 | 2005 | 2004 | 2002
Nombre de documents: 9

2013

Ameri, M., Kamrani, E., Hashemi, S., & Sawan, M. (mai 2013). A fast quench-reset integrated circuit for high-speed single photon detection [Communication écrite]. 8th IEEE International Symposium on Medical Measurements and Applications (MeMeA 2013), Gatineau, QC, Canada. Lien externe

2012

Sawan, M., Hashemi, S., Karimian, M., Koubaa, Z., Zhang, J., Zhang, Y., Kashyap, R., El-Sayed, M., & El-Gamal, M. (novembre 2012). Configurable smart sensors interface and novel position sensors for avionic applications? [Communication écrite]. International Symposium, Research and Innovation for Transport Systems of the Future, Paris, France. Non disponible

2009

Hashemi, S., Sawan, M., & Savaria, Y. (juin 2009). Fully-integrated low-voltage high-efficiency CMOS rectifier for wirelessly powered devices [Communication écrite]. Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2009), Toulouse, France. Lien externe

Hashemi, S., Sawan, M., & Savaria, Y. (décembre 2009). A low-area power-efficient CMOS active rectifier for wirelessly powered medical devices [Communication écrite]. 16th IEEE International Conference on Electronics, Circuits and Systems, Yasmine Hammamet, Tunisia. Lien externe

Hashemi, S., Sawan, M., & Savaria, Y. (2009). A novel low-drop CMOS active rectifier for RF-powered devices: Experimental results. Microelectronics Journal, 40(11), 1547-1554. Lien externe

2006

Hashemi, S., Sawan, M., & Savaria, Y. (mai 2006). A power planning model for implantable stimulators [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2006), Island of Kos, Greece. Lien externe

2005

Hashemi, S., Sawan, M., & Savaria, Y. (décembre 2005). Modeling power budget requirements of implantable electronic devices [Communication écrite]. IEEE International Conference on Electronics, Circuits and Systems (ICECS 2005), Tunisie. Lien externe

2004

Hashemi, S., Sawan, M., & Savaria, Y. (juin 2004). Characterization of Stress Induced Defects in Deep Sub-Micron MOSFETS [Communication écrite]. 2nd Annual IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2004), Montréal, Québec. Lien externe

2002

Hashemi, S., Sawan, M., & Savaria, Y. (janvier 2002). Analysis of power chains in transcutaneously powered electronic implants [Communication écrite]. 7th Annual Conference of the International Functional Electrical Stimulation Society (IFESS 2002), Lubljana. Non disponible

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