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Pan, W., Washizaki, H., Yoshioka, N., Fukazawa, Y., Khomh, F., & Guéhéneuc, Y.-G. (2023, December). A Machine Learning Based Approach to Detect Machine Learning Design Patterns [Paper]. 30th Asia-Pacific Software Engineering Conference (APSEC 2023), Seoul, Korea, Republic of Seoul. External link
Tiwari, D., Washizaki, H., Fukazawa, Y., Fukuoka, T., Tamaki, J., Hosotani, N., Kohama, M., Guéhéneuc, Y.-G., & Khomh, F. (2020, May). Commit-defect and architectural metrics-based quality assessment of C language [Paper]. 15th International Conference on Evaluation of Novel Approaches to Software Engineering (ENASE 2020). External link
