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La Haye, M. L., Chapman, G. H., Jung, C., Cheung, D. Y. H., Djaja, S., & Audet, Y. (janvier 2023). Fault-tolerant photodiode and photogate active pixel sensors [Communication écrite]. Sensors and camera systems for scientific and industrial applications VI, San Jose, CA (12 pages). Lien externe
Cheung, D. Y. H., Chapman, G. H., Djaja, S., Audet, Y., Wai, B., & Jung, C. (janvier 2004). Fault tolerant Active Pixel Sensors for large area digital imaging systems [Communication écrite]. Optoelectronic integrated circuits VI, San Jose CA. Lien externe
Djaja, S., Chapman, G. H., Cheung, D. Y. H., & Audet, Y. (novembre 2003). Implementation and testing of fault-tolerant photodiode-based active pixel sensor (APS) [Communication écrite]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. Lien externe
