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Vasilevskiy, D., Simard, J. M., Caillat, T., Masut, R. A., & Turenne, S. (2016). Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using Si₈₀Ge₂₀ Polycrystalline Alloys. Journal of Electronic Materials, 45(3), 1540-1547. Lien externe
