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Bechir, A., & Kaminska, B. (avril 1995). BDD_FTEST: fast, backtrack-free test generator based on binary decision diagram representation [Communication écrite]. 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95, Seattle, WA, USA. Non disponible
Bechir, A., & Kaminska, B. (1995). CYCLOGEN: Automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation. IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 42(7), 446-452. Lien externe
