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Amihai, I., Kotriwala, A., Pareschi, D., Chioua, M., & Gitzel, R. (2021, July). Using learned health indicators and deep sequence models to predict industrial machine health [Paper]. 7th International Conference on Time Series and Forecasting (ITISE 2021), Gran Canaria, Spain (9 pages). Published in Engineering Proceedings, 5(1). Available
Amihai, I., Chioua, M., Gitzel, R., Kotriwala, A. M., Pareschi, D., Sosale, G., & Subbiah, S. (2018, July). Modeling Machine Health Using Gated Recurrent Units with Entity Embeddings and K-Means Clustering [Paper]. 16th IEEE International Conference on Industrial Informatics (INDIN 2018), Porto, Portugal. External link
Schmidt, B., Amihai, I., Chioua, M., Kotriwala, A. M., Hollender, M., Janka, D., Lenders, F., Schlake, J. C., Kloepper, B., & Abukwaik, H. (2023). Method and apparatus for monitoring machine learning models. [Procédé et appareils de surveillance de modèle d'apprentissage automatique]. (Patent Application no. EP4127846). External link
Schmidt, B., Amihai, I., Kotriwala, A. M., Chioua, M., Janka, D., Lenders, F., Schlake, J. C., Hollender, M., Abukwaik, H., & Kloepper, B. (2023). Method of transfer learning for a specific production process of an industrial plant. [Procédé d'apprentissage de transfert pour un procédé de production spécifique d'une installation industrielle]. (Patent Application no. EP4128071). External link
Kloepper, B., Schmidt, B., Amihai, I., Chioua, M., Schlake, J. C., Kotriwala, A. M., Hollender, M., Janka, D., Lenders, F., & Abukwaik, H. (2021). Data processing for industrial machine learning. [Traitement de donnees pour apprentissage machine industriel]. (Patent Application no. CA3173398). External link
Amihai, I., Kotriwala, A. M., Chioua, M., Lenders, F., Janka, D., Hollender, M., Schlake, J. C., Abukwaik, H., & Kloepper, B. (2021). Training an artificial intelligence module for industrial applications. [Formation d'un module d'intelligence artificielle pour applications industrielles]. (Patent Application no. CA3173428). External link
Amihai, I., Subbiah, S., Kotriwala, A. M., & Chioua, M. (2020). Apparatus for predicting equipment damage. [Appareil pour prédire une détérioration d'équipement]. (Patent Application no. WO2020193314). External link
