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Method and apparatus for monitoring machine learning models

Benedikt Schmidt, Ido Amihai, Moncef Chioua, Arzam Muzaffar Kotriwala, Martin Hollender, Dennis Janka, Felix Lenders, Jan Christoph Schlake, Benjamin Kloepper and Hadil Abukwaik

Patent Application (2023)

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Additional Information: Autres numéros : WO2021197796 (demande), CA3173270 (demande), US20230016668 (demande); Titre français : Procédé et appareils de surveillance de modèle d'apprentissage automatique
Department: Department of Chemical Engineering
PolyPublie URL: https://publications.polymtl.ca/56640/
Official URL: https://patents.google.com/patent/EP4127846
Date Deposited: 02 Nov 2023 15:35
Last Modified: 05 Apr 2024 12:04
Cite in APA 7: Schmidt, B., Amihai, I., Chioua, M., Kotriwala, A. M., Hollender, M., Janka, D., Lenders, F., Schlake, J. C., Kloepper, B., & Abukwaik, H. (2023). Method and apparatus for monitoring machine learning models. [Procédé et appareils de surveillance de modèle d'apprentissage automatique]. (Patent Application no. EP4127846). https://patents.google.com/patent/EP4127846

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