Methodology and Analysis of Broadband On-Wafer Liquid Measurements

Marie Mertens, Yasaman Kazemipour, Raphaël Trouillon, Nathan D. Orloff, James C. Booth, Ke Wu, Tomislav Marković, Angela C. Stelson, Dominique Schreurs

Article (2026)

Access this document
External link
Open access to the full text at the publisher's website

Uncontrolled Keywords

Funders:
U.S. Department of Commerce, National Institute of Standards and Technology (NIST), Funds for Scientific Research Flanders (FWO), KU Leuven
Grant number:
11K5823N, 11K5825N, G0A1220N, G0E3921N, C24E/20/035#55687091
Journal Title :
IEEE Journal of Microwaves
Publisher:
Institute of Electrical and Electronics Engineers
OAI:
oai:publications.polymtl.ca:81917
ORCID
Date Deposited:
09 Sep 2026 12:00
Last Modified:
14 Oct 2026 14:47
Cite in APA 7:
Mertens, M., Kazemipour, Y., Trouillon, R., Orloff, N. D., Booth, J. C., Wu, K., Marković, T., Stelson, A. C., & Schreurs, D. (2026). Methodology and Analysis of Broadband On-Wafer Liquid Measurements. IEEE Journal of Microwaves, 19 pages. https://doi.org/10.1109/jmw.2026.3726089

Statistics

Dimensions

Repository Staff Only

View Item
View Item