Marie Mertens, Yasaman Kazemipour, Raphaël Trouillon, Nathan D. Orloff, James C. Booth, Ke Wu
, Tomislav Marković, Angela C. Stelson, Dominique Schreurs
Article (2026)
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Department:
Funders:
U.S. Department of Commerce, National Institute of Standards and Technology (NIST), Funds for Scientific Research Flanders (FWO), KU Leuven
Grant number:
11K5823N, 11K5825N, G0A1220N, G0E3921N, C24E/20/035#55687091
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Journal Title
:
IEEE Journal of Microwaves
Publisher:
Institute of Electrical and Electronics Engineers
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OAI:
oai:publications.polymtl.ca:81917
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Date Deposited:
09 Sep 2026 12:00
Last Modified:
14 Oct 2026 14:47
Cite in APA 7:
Mertens, M., Kazemipour, Y., Trouillon, R., Orloff, N. D., Booth, J. C., Wu, K., Marković, T., Stelson, A. C., & Schreurs, D. (2026). Methodology and Analysis of Broadband On-Wafer Liquid Measurements. IEEE Journal of Microwaves, 19 pages. https://doi.org/10.1109/jmw.2026.3726089
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