Fadhel Ghannouchi and Rénato Bosisio
Paper (1993)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 0780312295 |
| PolyPublie URL: | https://publications.polymtl.ca/75145/ |
| Conference Title: | Instrumentation and Measurement Technology Conference 1993 |
| Conference Location: | Irvine, CA, USA |
| Conference Date(s): | 1993-05-18 - 1993-05-20 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/imtc.1993.382627 |
| Official URL: | https://doi.org/10.1109/imtc.1993.382627 |
| Date Deposited: | 30 Mar 2026 12:06 |
| Last Modified: | 30 Mar 2026 12:06 |
| Cite in APA 7: | Ghannouchi, F., & Bosisio, R. (1993, May). Device line characterization of Gunn diodes using six-port techniques [Paper]. Instrumentation and Measurement Technology Conference 1993, Irvine, CA, USA. https://doi.org/10.1109/imtc.1993.382627 |
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