Fadhel Ghannouchi and Rénato Bosisio
Paper (1991)
An external link is available for this item| Department: | Department of Electrical Engineering |
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| ISBN: | 0879425792 |
| PolyPublie URL: | https://publications.polymtl.ca/75142/ |
| Conference Title: | Instrumentation and Measurement Technology Conference |
| Conference Location: | Atlanta, GA, USA |
| Conference Date(s): | 1991-05-14 - 1991-05-16 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/imtc.1991.161571 |
| Official URL: | https://doi.org/10.1109/imtc.1991.161571 |
| Date Deposited: | 30 Mar 2026 12:20 |
| Last Modified: | 30 Mar 2026 12:20 |
| Cite in APA 7: | Ghannouchi, F., & Bosisio, R. (1991, May). A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization [Paper]. Instrumentation and Measurement Technology Conference, Atlanta, GA, USA. https://doi.org/10.1109/imtc.1991.161571 |
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