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A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization

Fadhel Ghannouchi and Rénato Bosisio

Paper (1991)

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Department: Department of Electrical Engineering
ISBN: 0879425792
PolyPublie URL: https://publications.polymtl.ca/75142/
Conference Title: Instrumentation and Measurement Technology Conference
Conference Location: Atlanta, GA, USA
Conference Date(s): 1991-05-14 - 1991-05-16
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/imtc.1991.161571
Official URL: https://doi.org/10.1109/imtc.1991.161571
Date Deposited: 30 Mar 2026 12:20
Last Modified: 30 Mar 2026 12:20
Cite in APA 7: Ghannouchi, F., & Bosisio, R. (1991, May). A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization [Paper]. Instrumentation and Measurement Technology Conference, Atlanta, GA, USA. https://doi.org/10.1109/imtc.1991.161571

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