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X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF SIMS)

L'Hocine Yahia and Laura Karina Mireles Nunez

Book Section (2017)

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Department: Department of Mechanical Engineering
Research Center: LIAB - Bioperformance Analysis and Innovation Laboratory
ISBN: 9780081007372
PolyPublie URL: https://publications.polymtl.ca/61530/
Editors: Maria Cristina Tanzi and Silvia Farè
Journal Title: Elsevier eBooks
Publisher: Elsevier BV
DOI: 10.1016/b978-0-08-100737-2.00004-2
Official URL: https://doi.org/10.1016/b978-0-08-100737-2.00004-2
Date Deposited: 18 Dec 2024 15:42
Last Modified: 18 Dec 2024 15:42
Cite in APA 7: Yahia, L., & Mireles Nunez, L. K. (2017). X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF SIMS). In Tanzi, M. C., & Farè, S. (eds.), Characterization of Polymeric Biomaterials (pp. 83-97). https://doi.org/10.1016/b978-0-08-100737-2.00004-2

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