Summary of the Fourth International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2023)

Matteo Biagiola, Nicolás Cardozo, Donghwan Shin, Foutse Khomh, Andrea Stocco and Vincenzo Riccio

Article (2023)

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Department:	Department of Computer Engineering and Software Engineering
PolyPublie URL:	https://publications.polymtl.ca/56860/
Journal Title:	ACM SIGSOFT Software Engineering Notes (vol. 48, no. 4)
Publisher:	ACM
DOI:	10.1145/3617946.3617953
Official URL:	https://doi.org/10.1145/3617946.3617953
Date Deposited:	20 Dec 2023 11:33
Last Modified:	08 Apr 2025 07:26

Cite in APA 7:	Biagiola, M., Cardozo, N., Shin, D., Khomh, F., Stocco, A., & Riccio, V. (2023). Summary of the Fourth International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2023). ACM SIGSOFT Software Engineering Notes, 48(4), 39-40. https://doi.org/10.1145/3617946.3617953
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