Gervais Leclerc and Arthur Yelon
Article (1984)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/52910/ |
| Journal Title: | Applied Optics (vol. 23, no. 16) |
| Publisher: | Optica Publishing Group |
| DOI: | 10.1364/ao.23.002760 |
| Official URL: | https://doi.org/10.1364/ao.23.002760 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 25 Sep 2024 16:44 |
| Cite in APA 7: | Leclerc, G., & Yelon, A. (1984). Birefringence measurements of thin dielectric films by the prism coupler method. Applied Optics, 23(16), 2760-2762. https://doi.org/10.1364/ao.23.002760 |
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