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Birefringence measurements of thin dielectric films by the prism coupler method

Gervais Leclerc and Arthur Yelon

Article (1984)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/52910/
Journal Title: Applied Optics (vol. 23, no. 16)
DOI: 10.1364/ao.23.002760
Official URL: https://doi.org/10.1364/ao.23.002760
Date Deposited: 18 Apr 2023 15:26
Last Modified: 05 Apr 2024 11:58
Cite in APA 7: Leclerc, G., & Yelon, A. (1984). Birefringence measurements of thin dielectric films by the prism coupler method. Applied Optics, 23(16), 2760-2762. https://doi.org/10.1364/ao.23.002760

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