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Design Pattern Detection for Reverse Engineering

Francesca Arcelli, Claudia Raibulet, Yann-Gaël Guéhéneuc, Giuliano Antoniol and Jason McC Smith

Paper (2006)

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Department: Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/50132/
Conference Title: 13th Working Conference on Reverse Engineering
Conference Location: Benevento, Italy
Conference Date(s): 2006-10-23 - 2006-10-27
Publisher: IEEE
DOI: 10.1109/wcre.2006.23
Official URL: https://doi.org/10.1109/wcre.2006.23
Date Deposited: 18 Apr 2023 15:17
Last Modified: 25 Sep 2024 16:40
Cite in APA 7: Arcelli, F., Raibulet, C., Guéhéneuc, Y.-G., Antoniol, G., & McC Smith, J. (2006, October). Design Pattern Detection for Reverse Engineering [Paper]. 13th Working Conference on Reverse Engineering, Benevento, Italy (1 page). https://doi.org/10.1109/wcre.2006.23

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