Piers Barrios, François Loison, Christophe Danjou and Benoît Eynard
Paper (2020)
An external link is available for this item| Department: | Department of Mathematics and Industrial Engineering |
|---|---|
| ISBN: | 9783030628079 |
| PolyPublie URL: | https://publications.polymtl.ca/47278/ |
| Conference Title: | 17th IFIP International Conference on Product Lifecycle Management (PLM 2020) : Product Lifecycle Management Enabling Smart X |
| Conference Location: | Rapperswill, Switzerland |
| Conference Date(s): | 2020-07-05 - 2020-07-08 |
| Publisher: | Springer International Publishing |
| DOI: | 10.1007/978-3-030-62807-9_55 |
| Official URL: | https://doi.org/10.1007/978-3-030-62807-9_55 |
| Date Deposited: | 18 Apr 2023 15:00 |
| Last Modified: | 08 Apr 2025 12:23 |
| Cite in APA 7: | Barrios, P., Loison, F., Danjou, C., & Eynard, B. (2020, July). PLM Migration in the Era of Big Data and IoT: Analysis of Information System and Data Topology [Paper]. 17th IFIP International Conference on Product Lifecycle Management (PLM 2020) : Product Lifecycle Management Enabling Smart X, Rapperswill, Switzerland. https://doi.org/10.1007/978-3-030-62807-9_55 |
|---|---|
Statistics
Dimensions
