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PLM Migration in the Era of Big Data and IoT: Analysis of Information System and Data Topology

Piers Barrios, François Loison, Christophe Danjou and Benoît Eynard

Paper (2020)

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Department: Department of Mathematics and Industrial Engineering
ISBN: 9783030628079
PolyPublie URL: https://publications.polymtl.ca/47278/
Conference Title: 17th IFIP International Conference on Product Lifecycle Management (PLM 2020) : Product Lifecycle Management Enabling Smart X
Conference Location: Rapperswill, Switzerland
Conference Date(s): 2020-07-05 - 2020-07-08
Publisher: Springer International Publishing
DOI: 10.1007/978-3-030-62807-9_55
Official URL: https://doi.org/10.1007/978-3-030-62807-9_55
Date Deposited: 18 Apr 2023 15:00
Last Modified: 08 Apr 2025 12:23
Cite in APA 7: Barrios, P., Loison, F., Danjou, C., & Eynard, B. (2020, July). PLM Migration in the Era of Big Data and IoT: Analysis of Information System and Data Topology [Paper]. 17th IFIP International Conference on Product Lifecycle Management (PLM 2020) : Product Lifecycle Management Enabling Smart X, Rapperswill, Switzerland. https://doi.org/10.1007/978-3-030-62807-9_55

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