Antoine Leblanc-Hotte, Nadine Sen Nkwe, Geneviève Chabot-Roy, El Bachir Affar, Sylvie Lesage, Jean-Sébastien Delisle and Yves-Alain Peter
Article (2019)
An external link is available for this item| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/43285/ |
| Journal Title: | Lab on a Chip (vol. 19, no. 3) |
| Publisher: | The Royal Society of Chemistry |
| DOI: | 10.1039/c8lc00938d |
| Official URL: | https://doi.org/10.1039/c8lc00938d |
| Date Deposited: | 18 Apr 2023 15:02 |
| Last Modified: | 08 Apr 2025 07:08 |
| Cite in APA 7: | Leblanc-Hotte, A., Sen Nkwe, N., Chabot-Roy, G., Affar, E. B., Lesage, S., Delisle, J.-S., & Peter, Y.-A. (2019). On-chip refractive index cytometry for whole-cell deformability discrimination. Lab on a Chip, 19(3), 464-474. https://doi.org/10.1039/c8lc00938d |
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