Fadhel M. Ghannouchi, François Beauregard and Guoxiang Zhao
Paper (1994)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
ISBN: | 0780318803 |
PolyPublie URL: | https://publications.polymtl.ca/43074/ |
Conference Title: | IEEE Instrumentation and Measurement Technology Conference (IMTC 1994) |
Conference Location: | Hamamatsu, Japan |
Conference Date(s): | 1994-05-10 - 1994-05-14 |
Publisher: | IEEE |
DOI: | 10.1109/imtc.1994.352066 |
Official URL: | https://doi.org/10.1109/imtc.1994.352066 |
Date Deposited: | 18 Apr 2023 15:25 |
Last Modified: | 08 Apr 2025 07:07 |
Cite in APA 7: | Ghannouchi, F. M., Beauregard, F., & Zhao, G. (1994, May). Phase distortion measurements for saturated MESFETs loaded with arbitrary impedance terminations [Paper]. IEEE Instrumentation and Measurement Technology Conference (IMTC 1994), Hamamatsu, Japan. https://doi.org/10.1109/imtc.1994.352066 |
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