T. S. Ramu, Michael R. Wertheimer
and Jolanta-Ewa Sapieha
Paper (1985)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/38216/ |
| Conference Title: | Conference on Electrical Insulation & Dielectric Phenomena |
| Conference Location: | Amherst, NY, USA |
| Conference Date(s): | 1985-10-20 - 1985-10-24 |
| Publisher: | IEEE |
| DOI: | 10.1109/ceidp.1985.7728272 |
| Official URL: | https://doi.org/10.1109/ceidp.1985.7728272 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 25 Sep 2024 16:22 |
| Cite in APA 7: | Ramu, T. S., Wertheimer, M. R., & Sapieha, J.-E. (1985, October). Dielectric properties of plasma-deposited thin films: A comparison of different materials [Paper]. Conference on Electrical Insulation & Dielectric Phenomena, Amherst, NY, USA. https://doi.org/10.1109/ceidp.1985.7728272 |
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