B. Lamontagne, Edward Sacher and Michael R. Wertheimer
Article (1993)
An external link is available for this itemDepartment: | Department of Engineering Physics |
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PolyPublie URL: | https://publications.polymtl.ca/38189/ |
Journal Title: | Applied Surface Science (vol. 64, no. 3) |
Publisher: | Elsevier |
DOI: | 10.1016/0169-4332(93)90026-8 |
Official URL: | https://doi.org/10.1016/0169-4332%2893%2990026-8 |
Date Deposited: | 18 Apr 2023 15:26 |
Last Modified: | 25 Sep 2024 16:22 |
Cite in APA 7: | Lamontagne, B., Sacher, E., & Wertheimer, M. R. (1993). X-ray photoelectron diffraction and spectroscopy of sputter-deposited or evaporated coinage metals on Si(100). Applied Surface Science, 64(3), 205-213. https://doi.org/10.1016/0169-4332%2893%2990026-8 |
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