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Capabilities and Limitations of RBS to Characterize Hyper-Thin Silicon Compound Layers on Various Polymeric Substrates

G. Dennler, A. Houdayer, P. Raynaud, Y. Ségui and Michael R. Wertheimer

Book Section (2002)

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Additional Information: Metallization of polymers 2. Montréal workshop on Polymer metallization held in Montréal in June 2001.
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/38157/
Editors: Edward Sacher
Publisher: Springer
DOI: 10.1007/978-1-4615-0563-1_14
Official URL: https://doi.org/10.1007/978-1-4615-0563-1_14
Date Deposited: 18 Apr 2023 15:20
Last Modified: 05 Apr 2024 11:32
Cite in APA 7: Dennler, G., Houdayer, A., Raynaud, P., Ségui, Y., & Wertheimer, M. R. (2002). Capabilities and Limitations of RBS to Characterize Hyper-Thin Silicon Compound Layers on Various Polymeric Substrates. In Sacher, E. (ed.), Metallization of Polymers 2 (153-163). https://doi.org/10.1007/978-1-4615-0563-1_14

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