Gilles Dennler, A. Houdayer, Patrice Raynaud, Y. Ségui and Michael R. Wertheimer
Book Section (2002)
An external link is available for this itemAdditional Information: | Metallization of polymers 2. Montréal workshop on Polymer metallization held in Montréal in June 2001. |
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Department: | Department of Engineering Physics |
ISBN: | 9781461505631 |
PolyPublie URL: | https://publications.polymtl.ca/38157/ |
Editors: | Edward Sacher |
Publisher: | Springer |
DOI: | 10.1007/978-1-4615-0563-1_14 |
Official URL: | https://doi.org/10.1007/978-1-4615-0563-1_14 |
Date Deposited: | 18 Apr 2023 15:20 |
Last Modified: | 08 Apr 2025 07:00 |
Cite in APA 7: | Dennler, G., Houdayer, A., Raynaud, P., Ségui, Y., & Wertheimer, M. R. (2002). Capabilities and Limitations of RBS to Characterize Hyper-Thin Silicon Compound Layers on Various Polymeric Substrates. In Sacher, E. (ed.), Metallization of Polymers 2 (pp. 153-163). https://doi.org/10.1007/978-1-4615-0563-1_14 |
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