Y. Liu, D. Zhang, H. Xu, Sayyed Mandi Aie-Emran and B. X. Du
Article (2016)
An external link is available for this item| Department: | Department of Electrical Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/36141/ |
| Journal Title: | IEEE Transactions on Dielectrics and Electrical Insulation (vol. 23, no. 4) |
| Publisher: | IEEE |
| DOI: | 10.1109/tdei.2016.7556484 |
| Official URL: | https://doi.org/10.1109/tdei.2016.7556484 |
| Date Deposited: | 18 Apr 2023 15:05 |
| Last Modified: | 08 Apr 2025 06:58 |
| Cite in APA 7: | Liu, Y., Zhang, D., Xu, H., Aie-Emran, S. M., & Du, B. X. (2016). Characteristic Analysis of Surface Damage and Bulk Micro-Cracks of SiR/SiO2 Nanocomposites Caused by Surface Arc Discharges. IEEE Transactions on Dielectrics and Electrical Insulation, 23(4), 2102-2109. https://doi.org/10.1109/tdei.2016.7556484 |
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