Mina Mirshahi, Vahid Partovi Nia and Luc Adjengue
Paper (2016)
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| Department: | Department of Mathematics and Industrial Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/35578/ |
| Conference Title: | 5th International Conference on Pattern Recognition Applications and Methods (ICPRAM 2016) |
| Conference Location: | Rome, Italy |
| Conference Date(s): | 2016-02-24 - 2016-02-26 |
| Publisher: | SciTePress |
| DOI: | 10.5220/0005628204070414 |
| Official URL: | https://doi.org/10.5220/0005628204070414 |
| Date Deposited: | 18 Apr 2023 15:06 |
| Last Modified: | 08 Apr 2025 12:21 |
| Cite in APA 7: | Mirshahi, M., Partovi Nia, V., & Adjengue, L. (2016, February). Statistical measurement validation with application to electronic nose technology [Paper]. 5th International Conference on Pattern Recognition Applications and Methods (ICPRAM 2016), Rome, Italy. https://doi.org/10.5220/0005628204070414 |
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