Mina Mirshahi, Vahid Partovi Nia, Luc Adjengue
Paper (2016)
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Conference Title:
5th International Conference on Pattern Recognition Applications and Methods (ICPRAM 2016)
Conference Location:
Rome, Italy
Conference Date(s):
2016-02-24 - 2016-02-26
Publisher:
SciTePress
Official URL:
OAI:
oai:publications.polymtl.ca:35578
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Date Deposited:
18 Apr 2023 15:06
Last Modified:
14 Oct 2026 13:25
Cite in APA 7:
Mirshahi, M., Partovi Nia, V., & Adjengue, L. (2016, February). Statistical measurement validation with application to electronic nose technology [Paper]. 5th International Conference on Pattern Recognition Applications and Methods (ICPRAM 2016), Rome, Italy. https://doi.org/10.5220/0005628204070414
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