Jane Huffman Hayes, Giuliano Antoniol
, Bram Adams and Yann-Gaël Guéhéneuc
Paper (2015)
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| Department: | Department of Computer Engineering and Software Engineering |
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| ISBN: | 9781467369053 |
| PolyPublie URL: | https://publications.polymtl.ca/34660/ |
| Conference Title: | 23rd IEEE International Requirements Engineering Conference (RE 2015) |
| Conference Location: | Ottawa, ON, Canada |
| Conference Date(s): | 2015-08-24 - 2015-08-28 |
| Publisher: | IEEE |
| DOI: | 10.1109/re.2015.7320422 |
| Official URL: | https://doi.org/10.1109/re.2015.7320422 |
| Date Deposited: | 18 Apr 2023 15:07 |
| Last Modified: | 08 Apr 2025 12:21 |
| Cite in APA 7: | Hayes, J. H., Antoniol, G., Adams, B., & Guéhéneuc, Y.-G. (2015, August). Inherent characteristics of traceability artifacts: Less is more [Paper]. 23rd IEEE International Requirements Engineering Conference (RE 2015), Ottawa, ON, Canada. https://doi.org/10.1109/re.2015.7320422 |
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