Multi-tone transistor characterization for intermodulation and distortion analysis

R. Hajji, F. Beauregard, Fadhel M. Ghannouchi

Paper (1996)

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Nom historique du département: Département de génie électrique et de génie informatique
Conference Title:
IEEE MTT-S International Microwave Symposium (IMS 1996)
Conference Location:
San Franscisco, CA, USA
Conference Date(s):
1996-06-17 - 1996-06-21
Publisher:
IEEE
OAI:
oai:publications.polymtl.ca:31266
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Date Deposited:
18 Apr 2023 15:24
Last Modified:
14 Oct 2026 13:18
Cite in APA 7:
Hajji, R., Beauregard, F., & Ghannouchi, F. M. (1996, June). Multi-tone transistor characterization for intermodulation and distortion analysis [Paper]. IEEE MTT-S International Microwave Symposium (IMS 1996), San Franscisco, CA, USA. https://doi.org/10.1109/mwsym.1996.512266

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