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On the effects of retiming applied to self-checking sequential circuit

S. Lejmi, Guy Bois and Yvon Savaria

Paper (1996)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/31097/
Conference Title: 2nd IEEE On-Line Testing Workshop
Conference Location: Biarritz
Conference Date(s): 1996-01-01 - 1996-12-31
Date Deposited: 18 Apr 2023 15:24
Last Modified: 25 Sep 2024 16:12
Cite in APA 7: Lejmi, S., Bois, G., & Savaria, Y. (1996, January). On the effects of retiming applied to self-checking sequential circuit [Paper]. 2nd IEEE On-Line Testing Workshop, Biarritz.

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