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Study on the morphology of XLPE power cable by means of atomic force microscopy

Christian Robertson, Michael R. Wertheimer, Daniel Fournier and Laurent Lamarre

Article (1996)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/30919/
Journal Title: IEEE Transactions on Dielectrics and Electrical Insulation (vol. 3, no. 2)
Publisher: IEEE
DOI: 10.1109/94.486780
Official URL: https://doi.org/10.1109/94.486780
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:20
Cite in APA 7: Robertson, C., Wertheimer, M. R., Fournier, D., & Lamarre, L. (1996). Study on the morphology of XLPE power cable by means of atomic force microscopy. IEEE Transactions on Dielectrics and Electrical Insulation, 3(2), 283-288. https://doi.org/10.1109/94.486780

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