Study on the morphology of XLPE power cable by means of atomic force microscopy

Christian Robertson, Michael R. Wertheimer, Daniel Fournier and Laurent Lamarre

Article (1996)

An external link is available for this item

Department:	Department of Engineering Physics
PolyPublie URL:	https://publications.polymtl.ca/30919/
Journal Title:	IEEE Transactions on Dielectrics and Electrical Insulation (vol. 3, no. 2)
Publisher:	IEEE
DOI:	10.1109/94.486780
Official URL:	https://doi.org/10.1109/94.486780
Date Deposited:	18 Apr 2023 15:24
Last Modified:	08 Apr 2025 06:51

Cite in APA 7:	Robertson, C., Wertheimer, M. R., Fournier, D., & Lamarre, L. (1996). Study on the morphology of XLPE power cable by means of atomic force microscopy. IEEE Transactions on Dielectrics and Electrical Insulation, 3(2), 283-288. https://doi.org/10.1109/94.486780
APA 7 (HTML)ASCII CitationAtomBibTeXDOIsDublin CoreEndNote (.ENW)MARC (ISO 2709/UTF-8) (.MRC)MARC (UTF-8) (.MRK8)MARC XMLMPEG-21 DIDLMultiline CSVOAI-ORE Resource Map (Atom Format)OPENAIREOpenURL ContextObjectOpenURL ContextObject in SpanRDF+N-TriplesRDF+N3RDF+XMLReferReference Manager (.RIS)Simple Metadata

Statistics

Repository Staff Only