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Optical communication channel test using BIST approaches

Mathieu Gagnon and Bożena Kamińska

Paper (1997)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/30461/
Conference Title: 1997 IEEE International Test Conference
Conference Location: Washington, DC, USA
Conference Date(s): 1997-11-03 - 1997-11-05
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/test.1997.639672
Official URL: https://doi.org/10.1109/test.1997.639672
Date Deposited: 18 Apr 2023 15:23
Last Modified: 14 Apr 2026 10:31
Cite in APA 7: Gagnon, M., & Kamińska, B. (1997, November). Optical communication channel test using BIST approaches [Paper]. 1997 IEEE International Test Conference, Washington, DC, USA. https://doi.org/10.1109/test.1997.639672

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