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Analysis of the x-ray photoelectron spectrum of teflon af 1600

Edward Sacher and Jolanta-Ewa Sapieha

Article (1997)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/30098/
Journal Title: Journal of vacuum science and technology. A, Vacuum, surfaces, and films (vol. 15, no. 4)
Publisher: American Vacuum Society
DOI: 10.1116/1.580620
Official URL: https://doi.org/10.1116/1.580620
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:19
Cite in APA 7: Sacher, E., & Sapieha, J.-E. (1997). Analysis of the x-ray photoelectron spectrum of teflon af 1600. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 15(4), 2143-2147. https://doi.org/10.1116/1.580620

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