Edward Sacher and Jolanta-Ewa Sapieha
Article (1997)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/30098/ |
| Journal Title: | Journal of vacuum science and technology. A, Vacuum, surfaces, and films (vol. 15, no. 4) |
| Publisher: | American Vacuum Society |
| DOI: | 10.1116/1.580620 |
| Official URL: | https://doi.org/10.1116/1.580620 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:11 |
| Cite in APA 7: | Sacher, E., & Sapieha, J.-E. (1997). Analysis of the x-ray photoelectron spectrum of teflon af 1600. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 15(4), 2143-2147. https://doi.org/10.1116/1.580620 |
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