Patrice Chartrand
and Arthur Pelton
Article (1999)
An external link is available for this item
| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
|---|---|
| Department: | Department of Engineering Physics |
| Research Center: | CRCT - Centre for Research in Computational Thermochemistry |
| PolyPublie URL: | https://publications.polymtl.ca/29046/ |
| Journal Title: | Calphad-Computer Coupling of Phase Diagrams and Thermochemistry (vol. 23, no. 2) |
| Publisher: | Elsevier |
| DOI: | 10.1016/s0364-5916(99)00026-7 |
| Official URL: | https://doi.org/10.1016/s0364-5916%2899%2900026-7 |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 25 Sep 2024 16:10 |
| Cite in APA 7: | Chartrand, P., & Pelton, A. (1999). Modeling the Charge Compensation Effect in Silica-Rich Na₂O- K₂O-Al₂O₃-SiO₂ Melts. Calphad-Computer Coupling of Phase Diagrams and Thermochemistry, 23(2), 219-230. https://doi.org/10.1016/s0364-5916%2899%2900026-7 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
