A. V. Kabashin, J. P. Sylvestre, Sergiy Patskovsky and Michel Meunier
Article (2002)
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| Department: | Department of Engineering Physics |
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| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/26543/ |
| Journal Title: | Journal of Applied Physics (vol. 91, no. 5) |
| Publisher: | American Institute of Physics |
| DOI: | 10.1063/1.1446217 |
| Official URL: | https://doi.org/10.1063/1.1446217 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 21 Mar 2025 17:15 |
| Cite in APA 7: | Kabashin, A. V., Sylvestre, J. P., Patskovsky, S., & Meunier, M. (2002). Correlation Between Photoluminescence Properties and Morphology of Laser-Ablated Si/SiOₓ Nanostructured Films. Journal of Applied Physics, 91(5), 3248-3254. https://doi.org/10.1063/1.1446217 |
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