Model of Charge Migration During Thermal Poling in Silica Glasses: Evidence of a Voltage Threshold for the Onset of a Second-Order Nonlinearity

Yves Quiquempois, Nicolas Godbout and Suzanne Lacroix

Article (2002)

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Department:	Department of Engineering Physics
PolyPublie URL:	https://publications.polymtl.ca/26343/
Journal Title:	Physical Review A (vol. 65, no. 4)
Publisher:	American Physical Society
DOI:	10.1103/physreva.65.043816
Official URL:	https://doi.org/10.1103/physreva.65.043816
Date Deposited:	18 Apr 2023 15:21
Last Modified:	25 Sep 2024 16:06

Cite in APA 7:	Quiquempois, Y., Godbout, N., & Lacroix, S. (2002). Model of Charge Migration During Thermal Poling in Silica Glasses: Evidence of a Voltage Threshold for the Onset of a Second-Order Nonlinearity. Physical Review A, 65(4), 043816-043816. https://doi.org/10.1103/physreva.65.043816
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