Y. Dupont, Guy Cloutier and J. R. René Mayer
Paper (2003)
This item is not archived in PolyPublieDepartment: | Department of Mechanical Engineering |
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PolyPublie URL: | https://publications.polymtl.ca/25939/ |
Conference Title: | Laser Metrology and Machine Performance VI |
Publisher: | WIT Press |
Date Deposited: | 18 Apr 2023 15:19 |
Last Modified: | 25 Sep 2024 16:06 |
Cite in APA 7: | Dupont, Y., Cloutier, G., & Mayer, J. R. R. Identification Method for Scale, Pitch and Yaw Deviations With Linear Measurements [Paper]. Laser Metrology and Machine Performance VI. |
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