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Identification Method for Scale, Pitch and Yaw Deviations With Linear Measurements

Y. Dupont, Guy Cloutier and J. R. René Mayer

Paper (2003)

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Department: Department of Mechanical Engineering
PolyPublie URL: https://publications.polymtl.ca/25939/
Conference Title: Laser Metrology and Machine Performance VI
Publisher: WIT Press
Date Deposited: 18 Apr 2023 15:19
Last Modified: 25 Sep 2024 16:06
Cite in APA 7: Dupont, Y., Cloutier, G., & Mayer, J. R. R. Identification Method for Scale, Pitch and Yaw Deviations With Linear Measurements [Paper]. Laser Metrology and Machine Performance VI.

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