Domain decomposition FDTD algorithm combining with numerical TL calibration technique for parameter extraction of substrate integrated circuits

Feng Xu and Ke Wu

Paper (2005)

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Department:	Department of Electrical Engineering
Research Center:	POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics
PolyPublie URL:	https://publications.polymtl.ca/23542/
Conference Title:	IEEE MTT-S International Microwave Symposium (IMS 2005)
Conference Location:	Long Beach, CA, USA
Conference Date(s):	2005-06-17
Publisher:	IEEE
DOI:	10.1109/mwsym.2005.1516556
Official URL:	https://doi.org/10.1109/mwsym.2005.1516556
Date Deposited:	18 Apr 2023 15:18
Last Modified:	08 Apr 2025 02:11

Cite in APA 7:	Xu, F., & Wu, K. (2005, June). Domain decomposition FDTD algorithm combining with numerical TL calibration technique for parameter extraction of substrate integrated circuits [Paper]. IEEE MTT-S International Microwave Symposium (IMS 2005), Long Beach, CA, USA. https://doi.org/10.1109/mwsym.2005.1516556
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