Sergiy Patskovsky, S. Bah, Michel Meunier
and Andrei Kabashin
Article (2006)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/22653/ |
| Journal Title: | Applied Optics (vol. 45, no. 25) |
| Publisher: | Optical Society of America |
| DOI: | 10.1364/ao.45.006640 |
| Official URL: | https://doi.org/10.1364/ao.45.006640 |
| Date Deposited: | 18 Apr 2023 15:18 |
| Last Modified: | 08 Apr 2025 02:10 |
| Cite in APA 7: | Patskovsky, S., Bah, S., Meunier, M., & Kabashin, A. (2006). Characterization of high refractive index semiconductor films by surface plasmon resonance. Applied Optics, 45(25), 6640-6645. https://doi.org/10.1364/ao.45.006640 |
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