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Characterization of high refractive index semiconductor films by surface plasmon resonance

S. Patskovsky, S. Bah, Michel Meunier and Andrei Kabashin

Article (2006)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/22653/
Journal Title: Applied Optics (vol. 45, no. 25)
Publisher: Optical Society of America
DOI: 10.1364/ao.45.006640
Official URL: https://doi.org/10.1364/ao.45.006640
Date Deposited: 18 Apr 2023 15:18
Last Modified: 05 Apr 2024 11:07
Cite in APA 7: Patskovsky, S., Bah, S., Meunier, M., & Kabashin, A. (2006). Characterization of high refractive index semiconductor films by surface plasmon resonance. Applied Optics, 45(25), 6640-6645. https://doi.org/10.1364/ao.45.006640

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