Serge Ouellet, Bruno Bussière, Mostafa Benzaazoua and Michel Aubertin
Paper (2007)
This item is not archived in PolyPublie
| Department: | Department of Civil, Geological and Mining Engineering |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/21542/ |
| Conference Title: | 9th International Symposium in Mining with Backfill |
| Conference Location: | Montréal, Québec |
| Conference Date(s): | 2007-04-29 - 2007-05-02 |
| Date Deposited: | 18 Apr 2023 15:17 |
| Last Modified: | 25 Sep 2024 16:00 |
| Cite in APA 7: | Ouellet, S., Bussière, B., Benzaazoua, M., & Aubertin, M. (2007, April). SEM-XMAP : scanning electron microscopy and X-ray dot-mapping applied to cemented paste backfill [Paper]. 9th International Symposium in Mining with Backfill, Montréal, Québec. |
|---|---|
Statistics
Stats are not available on this system.
Repository Staff Only
|
View Item |
