J. L. Brusso, O. D. Hirst, A. Dadvand, S. Ganesan, Fabio Cicoira, C. M. Robertson, R. T. Oakley, F. Rosei and D. F. Perepichka
Article (2008)
Document published while its authors were not affiliated with Polytechnique Montréal
An external link is available for this itemPolyPublie URL: | https://publications.polymtl.ca/21027/ |
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Journal Title: | Chemistry of Materials (vol. 20, no. 7) |
Publisher: | American Chemical Society (ACS) |
DOI: | 10.1021/cm7030653 |
Official URL: | https://doi.org/10.1021/cm7030653 |
Date Deposited: | 18 Apr 2023 15:15 |
Last Modified: | 25 Sep 2024 15:59 |
Cite in APA 7: | Brusso, J. L., Hirst, O. D., Dadvand, A., Ganesan, S., Cicoira, F., Robertson, C. M., Oakley, R. T., Rosei, F., & Perepichka, D. F. (2008). Two-dimensional structural motif in thienoacene semiconductors: synthesis, structure, and properties of tetrathienoanthracene isomers. Chemistry of Materials, 20(7), 2484-2494. https://doi.org/10.1021/cm7030653 |
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