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Mendel : a model , metric, and rules to understand class hierarchies

Simon Denier and Yann-Gaël Guéhéneuc

Paper (2008)

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Department: Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/20893/
Conference Title: 16th IEEE International Conference on Program Comprehension (ICPC 2008)
Conference Location: Amsterdam, The Netherlands
Conference Date(s): 2008-06-10 - 2008-06-13
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/icpc.2008.37
Official URL: https://doi.org/10.1109/icpc.2008.37
Date Deposited: 18 Apr 2023 15:15
Last Modified: 08 Apr 2025 02:08
Cite in APA 7: Denier, S., & Guéhéneuc, Y.-G. (2008, June). Mendel : a model , metric, and rules to understand class hierarchies [Paper]. 16th IEEE International Conference on Program Comprehension (ICPC 2008), Amsterdam, The Netherlands. https://doi.org/10.1109/icpc.2008.37

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