Aaron M. Lindenberg, S. Engemann, Kelly J. Gaffney, K. Sokolowski-Tinten, Jörgen Larsson, D. Reis, Patrick Lorazo and J. B. Hastings
Paper (2008)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/20532/ |
| Conference Title: | High-Power Laser Ablation VII |
| Conference Location: | Taos, NM, United states |
| Conference Date(s): | 2008-04-20 - 2008-04-24 |
| Publisher: | SPIE |
| DOI: | 10.1117/12.784094 |
| Official URL: | https://doi.org/10.1117/12.784094 |
| Date Deposited: | 18 Apr 2023 15:16 |
| Last Modified: | 08 Apr 2025 02:07 |
| Cite in APA 7: | Lindenberg, A. M., Engemann, S., Gaffney, K. J., Sokolowski-Tinten, K., Larsson, J., Reis, D., Lorazo, P., & Hastings, J. B. (2008, April). Femtosecond x-ray diffuse scattering measurements of semiconductor ablation dynamics [Paper]. High-Power Laser Ablation VII, Taos, NM, United states. https://doi.org/10.1117/12.784094 |
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