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Femtosecond x-ray diffuse scattering measurements of semiconductor ablation dynamics

A. M. Lindenberg, S. Engemann, K. J. Gaffney, K. Sokolowski-Tinten, J. Larsson, D. Reis, Patrick Lorazo and J. B. Hastings

Paper (2008)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/20532/
Conference Title: High-Power Laser Ablation VII
Conference Location: Taos, NM, United states
Conference Date(s): 2008-04-20 - 2008-04-24
Publisher: SPIE
DOI: 10.1117/12.784094
Official URL: https://doi.org/10.1117/12.784094
Date Deposited: 18 Apr 2023 15:16
Last Modified: 05 Apr 2024 11:03
Cite in APA 7: Lindenberg, A. M., Engemann, S., Gaffney, K. J., Sokolowski-Tinten, K., Larsson, J., Reis, D., Lorazo, P., & Hastings, J. B. (2008, April). Femtosecond x-ray diffuse scattering measurements of semiconductor ablation dynamics [Paper]. High-Power Laser Ablation VII, Taos, NM, United states. https://doi.org/10.1117/12.784094

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