A. Wozniak, J. R. René Mayer and Marek Balazinski
Article (2009)
An external link is available for this itemDepartment: | Department of Mechanical Engineering |
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PolyPublie URL: | https://publications.polymtl.ca/18808/ |
Journal Title: | International Journal of Advanced Manufacturing Technology (vol. 42, no. 5-6) |
Publisher: | Springer |
DOI: | 10.1007/s00170-008-1615-1 |
Official URL: | https://doi.org/10.1007/s00170-008-1615-1 |
Date Deposited: | 18 Apr 2023 15:15 |
Last Modified: | 25 Sep 2024 15:56 |
Cite in APA 7: | Wozniak, A., Mayer, J. R. R., & Balazinski, M. (2009). Stylus tip envelop method: Corrected measured point determination in high definition coordinate metrology. International Journal of Advanced Manufacturing Technology, 42(5-6), 505-514. https://doi.org/10.1007/s00170-008-1615-1 |
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