V. Arnaoudova, L. Eshkevari, R. Oliveto, Yann-Gaël Guéhéneuc and Giuliano Antoniol
Paper (2010)
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| Department: | Department of Computer Engineering and Software Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/18713/ |
| Conference Title: | 26th IEEE International Conference on Software Maintenance (ICSM 2010) |
| Conference Location: | Timisoara, Romania |
| Conference Date(s): | 2010-09-12 - 2010-09-18 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/icsm.2010.5609748 |
| Official URL: | https://doi.org/10.1109/icsm.2010.5609748 |
| Date Deposited: | 18 Apr 2023 15:13 |
| Last Modified: | 25 Sep 2024 15:56 |
| Cite in APA 7: | Arnaoudova, V., Eshkevari, L., Oliveto, R., Guéhéneuc, Y.-G., & Antoniol, G. (2010, September). Physical and Conceptual Identifier Dispersion: Measures and Relation to Fault Proneness [Paper]. 26th IEEE International Conference on Software Maintenance (ICSM 2010), Timisoara, Romania (5 pages). https://doi.org/10.1109/icsm.2010.5609748 |
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